NC-AFM 2000

Noise in NC-AFM measurements with significant tip–sample interaction

The frequency shift noise in non-contact atomic force microscopy (NC-AFM) imaging and spectroscopy consists of thermal noise and detection system noise with an additional contribution from amplitude noise if there are significant tip-sample interactions. The total noise power spectral density DΔf (fm) is, however, not just the sum of these noise contributions. Instead its magnitude and spectral...

1 Nc - 213 2000 Annual Progress

s Awika, J.M., L.W. Rooney, R.D. Waniska. 2000. Comparing antioxidant potential of high tannin sorghums with those of common fruits and vegetables. AACC 85th Annual Meeting, November 5-9, Kansas City, MO. Gordon, L.A., M. Mitre_Dieste, J. Awika, L.W. Rooney, L.W., E.L. Suhendro, and R.D. Waniska. 2000. Characteristics of breads baked with sorghum brans high in antioxidants. AACC 85th Annual Mee...

Realistic model tips in simulations of nc-AFM

In this study we use first principle methods to study the interaction of three different tip models with a CaF2(111) surface. The tip models are based on a ‘realistic’ approach to tip simulation and consist of a pure silicon tip, an oxygen terminated silicon tip and a water contaminated silica (SiO2) tip. We find that each tip demonstrates characteristic features which should be observable in e...

Nc-afm Imaging of Defect Reactions at Metal Oxide Surfaces: Theoretical Predictions

The practice of NC-AFM (Non-contact Atomic Force Microscopy) imaging with atomic resolution has been achieved on several metal oxide surfaces, such as TiO2 [1] and CeO2 [2]. With this comes the opportunity to use AFM as a tool to examine surface chemistry in a direct manner. This is especially needed on wide-gap insulating materials, where STM methods are not applicable. However, the interpreta...

Nanostripes Developed on Batio3 Surface by Nc-afm, Dongbo Li and Dawn Bonnell